Particle Induced Electron Emission I

Particle Induced Electron Emission I

M. Rosier, W. Brauer (auth.), Dr. Max Rösler, Professor Dr. Wolfram Brauer, Professor Dr. Jacques Devooght, Professor Dr. Jean-Claude Dehaes, Professor Dr. Alain Dubus, Dr. Michel Cailler, Professor Dr. Jean-Pierre Ganachaud (eds.)
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This monograph discusses collision-induced electron emission from nearly free-electron metals by ion or electron impact. This subject is, as is well known, of acute importance in understanding plasma-wall interactions in thermonuclear reactors. It is also the basis for one of the most exciting technological developments of the last few years - scanning electron miscroscopy. Several electron excitation mechanisms of electrons in the target are considered: excitation of single conduction and core electrons, excitation by plasmon decay and by Auger processes. Transport of inner excited electrons is simulated by the Boltzmann equation incorporating both elastic and inelastic collisions. The numerical calculation of scattering rates uses a dynamically screened Coulomb interaction. These results for the energy distributions of emerging electrons as well as the electron yield are compared with recent experimental measurements on electron emission from polycrystalline aluminum.
Категории:
Година:
1991
Издателство:
Springer Berlin Heidelberg
Език:
english
Страници:
137
ISBN 10:
3540534318
ISBN 13:
9783540534310
Серия:
Springer Tracts in Modern Physics 122
Файл:
PDF, 2.20 MB
IPFS:
CID , CID Blake2b
english, 1991
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